On defects, they've demonstrated over the micron scale which they increase no new defects to the layer transferred for the SmartSiC, on the other hand upcoming do the job to increase that to the entire wafer would offer certainty on the macro pattern. The opportunity for unbiased validation of those https://www.quora.com/profile/Trevor-Flatcher-2/Comparative-analysis-of-silicon-carbide-and-traditional-silicon-materials-Silicon-Carbide-vs-Traditional-Silicon-Mater